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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">vestifm</journal-id><journal-title-group><journal-title xml:lang="ru">Известия Национальной академии наук Беларуси. Серия физико-математических наук</journal-title><trans-title-group xml:lang="en"><trans-title>Proceedings of the National Academy of Sciences of Belarus. Physics and Mathematics Series</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">1561-2430</issn><issn pub-type="epub">2524-2415</issn><publisher><publisher-name>The Republican Unitary Enterprise Publishing House "Belaruskaya Navuka"</publisher-name></publisher></journal-meta><article-meta><article-id custom-type="elpub" pub-id-type="custom">vestifm-128</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>ИНФОРМАТИКА</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>INFORMATICS</subject></subj-group></article-categories><title-group><article-title>ПОИСК КРАТЧАЙШЕЙ УСТАНОВОЧНОЙ ПОСЛЕДОВАТЕЛЬНОСТИ СХЕМЫ С ПАМЯТЬЮ НА D-ТРИГГЕРАХ</article-title><trans-title-group xml:lang="en"><trans-title>SHORTEST SYNCHRONIZING SEQUENCE SEARCH FOR A SEQUENTIAL NETWORK WITH MEMORY ON D FLIP-FLOPS</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Черемисинова</surname><given-names>Л. Д.</given-names></name><name name-style="western" xml:lang="en"><surname>Cheremisinova</surname><given-names>L. D.</given-names></name></name-alternatives><email xlink:type="simple">cld@newman.bas-net.by</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Объединенный институт проблем информатики Национальной академии наук Беларуси, Минск</institution></aff><aff xml:lang="en"><institution>United Institute of Informatics Problems of the National Academy of Sciences of Belarus, Minsk</institution></aff></aff-alternatives><pub-date pub-type="collection"><year>2015</year></pub-date><pub-date pub-type="epub"><day>19</day><month>05</month><year>2016</year></pub-date><volume>0</volume><issue>3</issue><fpage>119</fpage><lpage>128</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Черемисинова Л.Д., 2016</copyright-statement><copyright-year>2016</copyright-year><copyright-holder xml:lang="ru">Черемисинова Л.Д.</copyright-holder><copyright-holder xml:lang="en">Cheremisinova L.D.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://vestifm.belnauka.by/jour/article/view/128">https://vestifm.belnauka.by/jour/article/view/128</self-uri><abstract><p>Рассматривается задача поиска установочной последовательности наименьшей длины для логической схемы с памятью на D-триггерах. Предлагается метод сведения этой проблемы к задаче булевой выполнимости, которая может быть эффективно решена с помощью SAT-решателей. Метод основан на построении конъюнктивной нормальной формы разрешения комбинационного блока, реализующего функции возбуждения триггеров. </p></abstract><trans-abstract xml:lang="en"><p>The problem under consideration is to find a synchronizing sequence of a minimal size for a logical network having flipflop primitives of type D as memory elements. A novel method is proposed, which is based on the formulation of the task as the Boolean satisfiability problem solved with any standard SAT-solver. The method is based on forming the conventional conjunctive normal form representation for combinational block, implementing excitation functions of the flip-flops.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>тестирование</kwd><kwd>верификация</kwd><kwd>логический синтез</kwd><kwd>автоматизация проектирования</kwd></kwd-group><kwd-group xml:lang="en"><kwd>testing</kwd><kwd>verification</kwd><kwd>logic synthesis</kwd><kwd>design automation</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Strunz, B. Design for Testability in Digital Integrated circuits [Electronic resourсe] / B. Strunz , C. Flanagan , T. Hall ; University of Limerick, Ireland. – Mode of access: http://www.cs.colostate.edu/~cs530/digital_testing.pdf. – Date of access: 01.07.2015.</mixed-citation><mixed-citation xml:lang="en">Strunz, B. Design for Testability in Digital Integrated circuits [Electronic resourсe] / B. Strunz , C. Flanagan , T. Hall ; University of Limerick, Ireland. – Mode of access: http://www.cs.colostate.edu/~cs530/digital_testing.pdf. – Date of access: 01.07.2015.</mixed-citation></citation-alternatives></ref><ref id="cit2"><label>2</label><citation-alternatives><mixed-citation xml:lang="ru">Logic BIST: State-of-the-Art and Open Problems [Electronic resourсe] / N. Li [et al.]. – Mode of access: http://arxiv.org/ pdf/1503.04628.pdf. – Date of access: 01.07.2015.</mixed-citation><mixed-citation xml:lang="en">Logic BIST: State-of-the-Art and Open Problems [Electronic resourсe] / N. Li [et al.]. – Mode of access: http://arxiv.org/ pdf/1503.04628.pdf. – Date of access: 01.07.2015.</mixed-citation></citation-alternatives></ref><ref id="cit3"><label>3</label><citation-alternatives><mixed-citation xml:lang="ru">Chakrabarty, K. DFBT: A Design-for-Testability Method Based on Balance Testing [Electronic resourсe] / K. Chakrabarty, P. Hayes; Department of Electrical Engineering and Computer Science University of Michigan. – Mode of access: http://citeseerx. ist.psu.edu/viewdoc/download?doi=10.1.1.380.9873&amp;rep=rep1&amp;type=pdf. – Date of access: 01.07.2015.</mixed-citation><mixed-citation xml:lang="en">Chakrabarty, K. DFBT: A Design-for-Testability Method Based on Balance Testing [Electronic resourсe] / K. Chakrabarty, P. Hayes; Department of Electrical Engineering and Computer Science University of Michigan. – Mode of access: http://citeseerx. ist.psu.edu/viewdoc/download?doi=10.1.1.380.9873&amp;rep=rep1&amp;type=pdf. – Date of access: 01.07.2015.</mixed-citation></citation-alternatives></ref><ref id="cit4"><label>4</label><citation-alternatives><mixed-citation xml:lang="ru">Rene, D. Random testing of digital circuits. Theory and application / D. Rene. – [S. l.]: Marcel Dekker, Inc. 1998.</mixed-citation><mixed-citation xml:lang="en">Rene, D. Random testing of digital circuits. Theory and application / D. Rene. – [S. l.]: Marcel Dekker, Inc. 1998.</mixed-citation></citation-alternatives></ref><ref id="cit5"><label>5</label><citation-alternatives><mixed-citation xml:lang="ru">Crouch, A. Design-for-Test for Digital IC’s and Embedded Core Systems / A. Crouch. – [S. l.]: Prentice Hall, 1999.</mixed-citation><mixed-citation xml:lang="en">Crouch, A. Design-for-Test for Digital IC’s and Embedded Core Systems / A. Crouch. – [S. l.]: Prentice Hall, 1999.</mixed-citation></citation-alternatives></ref><ref id="cit6"><label>6</label><citation-alternatives><mixed-citation xml:lang="ru">Bushnell, M. L. Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits / M. L. Bushnell, V. D. Agrawal. – [S. l.]: Kluwer Academic Publishers, 2002.</mixed-citation><mixed-citation xml:lang="en">Bushnell, M. L. Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits / M. L. Bushnell, V. D. Agrawal. – [S. l.]: Kluwer Academic Publishers, 2002.</mixed-citation></citation-alternatives></ref><ref id="cit7"><label>7</label><citation-alternatives><mixed-citation xml:lang="ru">Kohavi, Z. Switching and Finite Automata Theory / Z. Kohavi. – 2nd ed. – Cambridge [et al.]: Cambridge Univ. Press, 1978.</mixed-citation><mixed-citation xml:lang="en">Kohavi, Z. Switching and Finite Automata Theory / Z. Kohavi. – 2nd ed. – Cambridge [et al.]: Cambridge Univ. Press, 1978.</mixed-citation></citation-alternatives></ref><ref id="cit8"><label>8</label><citation-alternatives><mixed-citation xml:lang="ru">Gill, A. Introduction to the Theory of Finite-state Machines / A. Gill. – [S. l.]: McGraw-Hill, 1962.</mixed-citation><mixed-citation xml:lang="en">Gill, A. Introduction to the Theory of Finite-state Machines / A. Gill. – [S. l.]: McGraw-Hill, 1962.</mixed-citation></citation-alternatives></ref><ref id="cit9"><label>9</label><citation-alternatives><mixed-citation xml:lang="ru">Lee, D. Principles and methods of testing finite state machine – a survey / D. Lee, M. Yannakakis // Proc. of the IEEE. – 1996. – Vol. 84 (8). – P. 1090–1123.</mixed-citation><mixed-citation xml:lang="en">Lee, D. Principles and methods of testing finite state machine – a survey / D. Lee, M. Yannakakis // Proc. of the IEEE. – 1996. – Vol. 84 (8). – P. 1090–1123.</mixed-citation></citation-alternatives></ref><ref id="cit10"><label>10</label><citation-alternatives><mixed-citation xml:lang="ru">Eppstein, D. Reset sequences for monotonic automata / D. Eppstein // SIAM J. on Computing. – 1990. – Vol. 19, no. 3. – P. 500–510.</mixed-citation><mixed-citation xml:lang="en">Eppstein, D. Reset sequences for monotonic automata / D. Eppstein // SIAM J. on Computing. – 1990. – Vol. 19, no. 3. – P. 500–510.</mixed-citation></citation-alternatives></ref><ref id="cit11"><label>11</label><citation-alternatives><mixed-citation xml:lang="ru">Biere, A. PicoSAT essentials / A. Biere // J. on Satisfiability. Boolean Modeling and Computation. – 2008. – Vol. 4. – P. 75–97.</mixed-citation><mixed-citation xml:lang="en">Biere, A. PicoSAT essentials / A. Biere // J. on Satisfiability. Boolean Modeling and Computation. – 2008. – Vol. 4. – P. 75–97.</mixed-citation></citation-alternatives></ref><ref id="cit12"><label>12</label><citation-alternatives><mixed-citation xml:lang="ru">Mahajan, Y. Zchaff 2004: an efficient SAT solver / Y. Mahajan, Z. Fu, S. Malik // Theory and Applications of Satisfiability Testing (2004 SAT Solver Competition and QBF Solver Evaluation (Invited Papers)). – Berlin; Heidelberg: Springer, 2005. – P. 360–375.</mixed-citation><mixed-citation xml:lang="en">Mahajan, Y. Zchaff 2004: an efficient SAT solver / Y. Mahajan, Z. Fu, S. Malik // Theory and Applications of Satisfiability Testing (2004 SAT Solver Competition and QBF Solver Evaluation (Invited Papers)). – Berlin; Heidelberg: Springer, 2005. – P. 360–375.</mixed-citation></citation-alternatives></ref><ref id="cit13"><label>13</label><citation-alternatives><mixed-citation xml:lang="ru">Goldberg, E. BerkMin: afast and robust SAT-solver / E. Goldberg, Y. Novikov // 2002 Design, Automation and Test in Europe Conference and Exposition (DATE 2002), 4–8 March 2002, Paris, France. – [S. l.]: IEEE Computer Society, 2002. – P. 142–149.</mixed-citation><mixed-citation xml:lang="en">Goldberg, E. BerkMin: afast and robust SAT-solver / E. Goldberg, Y. Novikov // 2002 Design, Automation and Test in Europe Conference and Exposition (DATE 2002), 4–8 March 2002, Paris, France. – [S. l.]: IEEE Computer Society, 2002. – P. 142–149.</mixed-citation></citation-alternatives></ref><ref id="cit14"><label>14</label><citation-alternatives><mixed-citation xml:lang="ru">Kuehlmann, A. Combinational and Sequential Equivalence Checking / A. Kuehlmann A., C. A. J. van Eijk. // Logic synthesis and Verification / eds S. Hassoun, T. Sasao, R. K. Brayton. – [S. l.]: Kluwer Academic Publishers, 2002. – P. 343–372.</mixed-citation><mixed-citation xml:lang="en">Kuehlmann, A. Combinational and Sequential Equivalence Checking / A. Kuehlmann A., C. A. J. van Eijk. // Logic synthesis and Verification / eds S. Hassoun, T. Sasao, R. K. Brayton. – [S. l.]: Kluwer Academic Publishers, 2002. – P. 343–372.</mixed-citation></citation-alternatives></ref></ref-list><fn-group><fn fn-type="conflict"><p>The authors declare that there are no conflicts of interest present.</p></fn></fn-group></back></article>
