vestifmИзвестия Национальной академии наук Беларуси. Серия физико-математических наукProceedings of the National Academy of Sciences of Belarus. Physics and Mathematics Series1561-24302524-2415The Republican Unitary Enterprise Publishing House "Belaruskaya Navuka"vestifm-217Research ArticleФИЗИКАPHYSICSИССЛЕДОВАНИЕ ТОНКИХ ПЛЕНОК Cu2ZnSnSe4 МЕТОДОМ АТОМНО-СИЛОВОЙ МИКРОСКОПИИINVESTIGATION OF Cu2ZnSnSe4 THIN FILMS BY ATOMIC FORCE MICROSCOPYСтанчикА. В.StanchikA. V.

аспирант

Postgraduate

alena.stanchik@bk.ruБарайшукС. М.BarajshukS. M.

кандидат физико-математических наук, заведующий кафедрой практической подготовки студентов

Ph. D. (Physics and Mathematics), Head of the Department of Practical Training of Students

bear_s@rambler.ruБашкировС. А.BashkirovS. A.

кандидат физико-математических наук, научный сотрудник

Ph. D. (Physics and Mathematics), Researcher

disput@yandex.byГременокВ. Ф.GremenokV. F.

доктор физико-математических наук, заведующий лабораторией физи-ки твердого тела

D. Sc. (Physics and Mathematics), Head of the Laboratory of Solid State Physics

gremenok@ifttp.bas-net.byТивановМ. С.TivanovM. S.

кандидат физико-математических наук, заведующий кафедрой энергофизики

Ph. D. (Physics and Mathematics), Head of the Energy Physics Department

tivanov@bsu.byДергачеваМ. Д.DergachevaM. V.

доктор химических наук

D . S c. ( Chemistry)

m_dergacheva@mail.ruУразовК. А.UrazovK. A.

аспирант

Postgraduate

u_kazhm@mail.ruНаучно-практический центр Национальной академии наук Беларуси по материаловедениюScientific-Practical Materials Research Centre of the National Academy of Sciences of BelarusБелорусский государственный аграрный технический университетBelarusian State Agrarian Technical UniversityБелорусский государственный университетBelarusian State UniversityИнститут топлива, катализа и электрохимии им. Д. В. СокольскогоSokolsky Institute of Fuel, Catalysis and ElectrochemistryИнститут топлива, катализа и электрохимии им. Д. В. Сокольского, Казахстанско-Британский технический университетSokolsky Institute of Fuel, Catalysis and Electrochemistry, Kazakh-British Technical University201620012017046775Copyright © Станчик А.В., Барайшук С.М., Башкиров С.А., Гременок В.Ф., Тиванов М.С., Дергачева М.Д., Уразов К.А., 20172017Станчик А.В., Барайшук С.М., Башкиров С.А., Гременок В.Ф., Тиванов М.С., Дергачева М.Д., Уразов К.А.Stanchik A.V., Barajshuk S.M., Bashkirov S.A., Gremenok V.F., Tivanov M.S., Dergacheva M.V., Urazov K.A.Данная работа распространяется под лицензией Creative Commons Attribution 4.0.This work is licensed under a Creative Commons Attribution 4.0 License.https://vestifm.belnauka.by/jour/article/view/217

Методом атомно-силовой микроскопии исследовано влияние типа подложки на структуру и шероховатость поверхности пленок Cu2ZnSnSe4, полученных методом селенизации металлических прекурсоров Cu-Zn-Sn на подложках из стекла с подслоем молибдена и молибденовой фольги (Мо/стекло, Мо-фольга). Обнаружено, что пленки Cu2ZnSnSe4 на подложках Мо/стекло и Мо-фольга имеют близкие значения шероховатости и зернистую структуру. Пленки Cu2ZnSnSe4 имеют более высокие значения шероховатости и максимальной высоты неровности профиля, чем металлические прекурсоры Cu-Zn-Sn. Увеличение шероховатости при формировании пленок Cu2ZnSnSe4 из прекурсоров происходит за счет роста зерен в процессе отжига и селенизации.

In comparison to the traditional use of glass substrates, the thin films onto metal substrates offer improved device cooling, economical large-scale roll-to-roll processing, and applicability in lightweight, as well as flexible products. However, unlike glass, metal foils tend to exhibit rough surfaces. This article studies the substrate-type (Mo/glass and Мо-foil) effect on the topographic characteristics of the Cu2ZnSnSe4 films by atomic force microscopy (AFM). Cu2ZnSnSe4 thin films were prepared by the electrodeposition of stack copper/tin/copper/zinc (Cu/Sn/Cu/Zn) precursors, followed by selenization. AFM wasused to study the topographic characteristics of thin films, including grain size, surface roughness, and maximum height of the profile. It is shown that the films obtained on Mo/glass and Mo-foil substrates have similar roughness and in the both cases the grain structure is formed. The Cu2ZnSnSe4 thin films show relatively high surface roughness and maximum roughness profile height compared to Cu-Zn-Sn precursors. The increase in the surface roughness of the films was caused by the growth of grains during annealing and selenization processes.

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The authors declare that there are no conflicts of interest present.