vestifmИзвестия Национальной академии наук Беларуси. Серия физико-математических наукProceedings of the National Academy of Sciences of Belarus. Physics and Mathematics Series1561-24302524-2415The Republican Unitary Enterprise Publishing House "Belaruskaya Navuka"10.29235/1561-2430-2025-61-2-149-158vestifm-840Research ArticleФИЗИКАPHYSICSМодель взаимодействия электромагнитного излучения с шероховатыми поверхностями, основанная на фрактальной геометрии, для микроэлектроники и радиофотоникиFractal geometry-based model of electromagnetic radiation interaction with rough surfaces for microelectronics and radiophotonics applicationsБогушВ. А.BogushV. A.

Богуш Вадим Анатольевич – доктор физико-математических наук, профессор, ректор, профессор кафедры защиты информации

ул. П. Бровки, 6, 220013, Минск

Vadim A. Bogush – Dr. Sc. (Physics and Mathematics), Professor, Rector, Professor of the Information Protection Department

6, P. Brovka Str., 220013, Minsk

bogush@bsuir.byБойправО. В.BoipravO. V.

Бойправ Ольга Владимировна – кандидат технических наук, доцент, доцент кафедры защиты информации

ул. П. Бровки, 6, 220013, Минск

Olga V. Boiprav – Ph. D. (Engineering), Associate Professor, Associate Professor of the Information Protection Department

6, P. Brovka Str., 220013, Minsk

smu@bsuir.byГринчикН. Н.GrinchikN. N.

Гринчик Николай Николаевич – доктор физико- математических наук, доцент, ведущий научный сотрудник лаборатории теплофизических измерений

ул. П. Бровки, 15, 220072, Минск

Nikolay N. Grinchik – Dr. Sc. (Physics and Mathematics), Associate Professor, Leading Researcher of the Labo ratory of Thermophysical Measurements

15, P. Brovka Str., 220072, Minsk

nngrin@yandex.ruБелорусский государственный университет информатики и радиоэлектроникиBelarusian State University of Informatics and RadioelectronicsИнститут тепло- и массообмена имени А. В. Лыкова Национальной академии наук БеларусиA. V. Luikov Heat and Mass Transfer Institute of the National Academy of Sciences of Belarus202511072025612149158Copyright © Богуш В.А., Бойправ О.В., Гринчик Н.Н., 20252025Богуш В.А., Бойправ О.В., Гринчик Н.Н.Bogush V.A., Boiprav O.V., Grinchik N.N.Данная работа распространяется под лицензией Creative Commons Attribution 4.0.This work is licensed under a Creative Commons Attribution 4.0 License.https://vestifm.belnauka.by/jour/article/view/840

Представлены результаты обоснования и апробации модели взаимодействия электромагнитного излучения с шероховатыми поверхностями. Данная модель отличается от аналогов следующим: 1) профили шероховатости поверхности описываются с помощью фрактальной геометрии; 2) учитывается, что распределение электрического поля по поверхностям характеризуется наличием сильных разрывов. Второе из указанных отличий привело к применению в рамках разработанной модели уравнений Максвелла, сведенных к волновым уравнениям. Полученная модель рекомендуется к использованию при проектировании тонкопленочных электромагнитных экранов для защиты изделий микроэлектроники от воздействия внешних и внутренних помех, при проектировании таких изделий и изделий радиофотоники, а также при теоретической оценке оптических и температурных свойств материалов.

The article presents the results of substantiation and approbation of the model of electromagnetic radiation interaction with rough surfaces. This model differs from analogues in the following: 1) surface roughness profiles are described using fractal geometry; 2) it is taken into account that the distribution of the electric field over the surfaces is characterized by the presence of strong discontinuities. The second of the indicated differences led to the use of Maxwell’s equations reduced to wave equations in the framework of the developed model. The developed model is recommended for use in the design of thin-film electromagnetic shields for microelectronics products protection from external and internal interference impact, as well as in the design of such products, in the design of radiophotonics products and theoretical evaluation of the optical and thermal properties of materials.

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The authors declare that there are no conflicts of interest present.