Fractal geometry-based model of electromagnetic radiation interaction with rough surfaces for microelectronics and radiophotonics applications
https://doi.org/10.29235/1561-2430-2025-61-2-149-158
Abstract
The article presents the results of substantiation and approbation of the model of electromagnetic radiation interaction with rough surfaces. This model differs from analogues in the following: 1) surface roughness profiles are described using fractal geometry; 2) it is taken into account that the distribution of the electric field over the surfaces is characterized by the presence of strong discontinuities. The second of the indicated differences led to the use of Maxwell’s equations reduced to wave equations in the framework of the developed model. The developed model is recommended for use in the design of thin-film electromagnetic shields for microelectronics products protection from external and internal interference impact, as well as in the design of such products, in the design of radiophotonics products and theoretical evaluation of the optical and thermal properties of materials.
About the Authors
V. A. Bogush
Belarusian State University of Informatics and Radioelectronics
Belarus
Belarus
Vadim A. Bogush – Dr. Sc. (Physics and Mathematics), Professor, Rector, Professor of the Information Protection Department
6, P. Brovka Str., 220013, Minsk
O. V. Boiprav
Belarusian State University of Informatics and Radioelectronics
Belarus
Belarus
Olga V. Boiprav – Ph. D. (Engineering), Associate Professor, Associate Professor of the Information Protection Department
6, P. Brovka Str., 220013, Minsk
N. N. Grinchik
A. V. Luikov Heat and Mass Transfer Institute of the National Academy of Sciences of Belarus
Belarus
Belarus
Nikolay N. Grinchik – Dr. Sc. (Physics and Mathematics), Associate Professor, Leading Researcher of the Labo ratory of Thermophysical Measurements
15, P. Brovka Str., 220072, Minsk
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